X-ray fluorescence (XRF) is a fast, non-destructive analytical technique used to determine the elemental composition of materials.
As X-rays interact with the sample, they excite electronic transitions in its atoms, causing emission of secondary (or fluorescent) X-rays unique to each element. Measuring the fluorescent emission allows precise, real-time identification and quantification of elements across a wide range of samples.
XRF is renowned for its speed, precision, and minimal sample preparation requirements, making it ideal for both routine analysis and complex research applications.
It is widely used in industries such as mining, environmental science, metallurgy, forensics, and archaeology to analyze solids, powders, liquids, and thin films.
Whether you are interested in material identification, quality control or regulatory compliance, XRF offers a cost-effective and reliable solution for elemental analysis across diverse sample types.
